Алгоритмы иерархического анализа тепловых процессов радиоэлектронных средств

Abstract

The article discusses key aspects of thermal processes occurring in radioelectronic devices and proposes algorithms that allow for effective analysis and prediction of temperature regimes in such constructions. The authors emphasize the importance of thermal analysis for ensuring the reliability and durability of radioelectronic equipment components, as well as the need to account for various factors affecting thermal characteristics. As a result of the conducted research, algorithms have been proposed that enable the optimization of thermal processes, enhancing the efficiency of radioelectronic devices. The article will be useful for specialists in the fields of thermal engineering, radioelectronics, and the development of high-tech systems, as well as for students and researchers interested in this topic.