Поиск по всему репозиторию:

Показать краткое описание

dc.contributor.authorВорсин, Николай Николаевич
dc.contributor.authorГладыщук, Анатолий Антонович
dc.contributor.authorКушнер, Татьяна Леонидовна
dc.contributor.authorТарасюк, Николай Петрович
dc.contributor.authorЧугунов, Сергей Владимирович
dc.contributor.authorБорушко, Марина Викторовна
dc.coverage.spatialМинскru_RU
dc.date.accessioned2026-02-11T08:03:19Z
dc.date.available2026-02-11T08:03:19Z
dc.date.issued2021
dc.identifier.citationModeling AlGaN P-I-N photodiodes / N. N. Vorsin, A. A. Gladyshchuk, T. L. Kushner, N. P. Tarasiuk [et al.]. – Text : direct // Доклады БГУИР. – 2021. – № 8. – P. 50–57 : il. – Bibliography: 15 titles.ru_RU
dc.identifier.urihttps://rep.bstu.by/handle/data/51049
dc.language.isoenru_RU
dc.publisherБГУИРru_RU
dc.titleModeling AlGaN P-I-N photodiodesru_RU
dc.typeНаучный доклад (Working Paper)ru_RU
dc.identifier.udc621.383.52ru_RU
dc.abstract.alternativeTernary AlGaN alloys with a band gap of 3.4 to 6.2 eV are very promising for photodetectors in the UV wavelength range. Using the COMSOL MULTIPHYSICS software based on AlGaN, a p-i-n photodiode model was developed, including its I–V characteristic, spectral sensitivity of the received radiation, absorption coefficient as a function of the aluminum fraction and the depletion layer thickness. To calculate the process of interaction of a semiconductor with EM radiation, we used a model based on the use of an element of the transition matrix through the carrier lifetime during spontaneous recombination. In this case, the peak sensitivity of the photodiode is from 0.08 to 0.18 A/W at wavelengths of 0.2–0.33 μm. This is in line with experimental results taken from the relevant literature.ru_RU
dc.identifier.doi10.35596/1729-7648-2021-19-8-50-57


Файлы в этом документе

Thumbnail

Данный элемент включен в следующие коллекции

Показать краткое описание